Improve your process efficiency through non-destructive elemental analysis at the production line.
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The Epsilon 1 is a fully integrated energy dispersive XRF analyzer consisting of a spectrometer, built-in computer, touch screen and analysis software. Powered by the latest advances in excitation and detection technology the Epsilon 1 is a star performer in the low-cost benchtop instrument class.
Epsilon 1 produces fast, cost-effective, precise and accurate data with minimal operator dependence and sample preparation. The total running cost is therefore much lower than other analytical techniques such as AAS, ICP and wet chemical methods that are costly and also require a dedicated skilled operator.
Epsilon 1 is built for the characterization and analysis of any type of sample in many industry segments such as cement, cosmetics, environmental, food, forensics, metals and coatings, mining and minerals, nanomaterials, petrochemicals, pharmaceuticals and polymers.
A number of out-of-the-box solutions are available for specific analytical needs. Those industry versions are pre-calibrated in the factory and ready to use for:
In order to shield the delicate heart of the system from spillage, a protection foil is in place. In case of spillage, the foil can be replaced easily by the operator.
The measurements are carried out directly on the sample itself with little to no sample preparation. Since XRF is a non-destructive technique, the sample can also be measured subsequently by other analytical techniques, if required.
USB and network connections for use of standard computer peripherals for extended use, application development and seated operator.
Low-energy X-ray photons characteristic of sodium, magnesium, aluminium, silicon, phosphorus and sulfur are sensitive to air-pressure and temperature variations. Built-in temperature and air-pressure sensors compensate for these atmospheric variations, ensuring excellent results whatever the weather.
|Liquids, solids, slurries, loose powders, filters|
|Highly repeatable sample positioning|
|Spillage protection against powders and liquids|
|High-stability ceramic side window|
|50 µm thin window (Be) for higher intensities|
|Max voltage of 50 kV, ideal for analyzing heavier elements|
|High-resolution, typical 135 eV|
|8 µm thin window (Be) for higher intensities|
|High count rate detector capacity for faster analysis|
|Operator mode with big buttons for easy operation|
|Advanced mode with many features|
|Omnian, Stratos, FingerPrint and Enhanced Data Security options|
XRF is an analytical technique that can be used to determine the chemical composition of a wide variety of sample types including solids, liquids, slurries and loose powders.
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