Improve your process efficiency and analytical research through non-destructive elemental analysis in process control and research and development.
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Epsilon 3X is a benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer that is used for elemental analysis in areas from R&D through to process control. Easy to operate, reliable and highly flexible, it is ideally suited to a broad range of industries and applications. The performance of the instrument is increased through 50 kV excitation capabilities, delivering excellent analytical performance
The unique combination of spinner with sample changer provides more accurate results of samples that are less homogeneous. With the 10-position sample changer no operator attendance is required during batch analysis.
The measurements are carried out directly on the sample itself with little to no sample preparation. Since XRF is a non-destructive technique, the sample can also be measured subsequently by other analytical techniques, if required.
The thin-window Ag anode X-ray tube, designed and manufactured by PANalytical, ensures high quality and sensitivity. The 50 kV X-ray tube and generator are ideal for exciting heavier elements, resulting in faster analysis times and higher accuracy.
Low-energy X-ray photons characteristic of sodium, magnesium, aluminium, silicon, phosphorus and sulfur are sensitive to air-pressure and temperature variations. Built-in temperature and air-pressure sensors compensate for these atmospheric variations, ensuring excellent results whatever the weather.
|10-position removable sample changer|
|Accommodates 25 to 52 mm diameter samples|
|Metal-ceramic side window|
|50 µm thin window (Be)|
|Software controlled, max. voltage 50 kV, max. 1 mA, max. 9 W|
|Typically 135 eV|
|8 µm thin window (Be)|
|High-resolution silicon drift|
|Enhanced Data Security|
XRF is an analytical technique that can be used to determine the chemical composition of a wide variety of sample types including solids, liquids, slurries and loose powders.
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