Improve your process efficiency and analytical research through higher sample throughput with improved and extended light element capabilities (C - Am)
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Epsilon 3XLE is a benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer that is used for elemental analysis from carbon (C) to americium (Am) in areas from R&D through to process control. Easy to operate, reliable and highly flexible, it is ideally suited to a broad range of industries and applications. The instrument is powered by the latest advances in excitation and detection technology, delivering excellent analytical performance. The SDDUltra silicon drift detector fitted in Epsilon 3XLE enables ultra-light element analysis of even carbon, nitrogen and oxygen.
The 15 Watt X-ray tube in combination with the high current (3 mA), latest silicon drift detector SDDUltra together with the compact design of the optical path, delivers even better analytical performance than 50 Watt power EDXRF and even benchtop WDXRF systems - with the added bonus of power efficiency. The SDDUltra silicon drift detector fitted in Epsilon 3XLE enables ultra-light element analysis of even carbon, nitrogen and oxygen.
The unique combination of spinner with sample changer provides more accurate results of samples that are less homogeneous. With the 10-position sample changer no operator attendance is required during batch analysis.
The measurements are carried out directly on the sample itself with little to no sample preparation. Since XRF is a non-destructive technique, the sample can also be measured subsequently by other analytical techniques, if required.
Low-energy X-ray photons characteristic of sodium, magnesium, aluminium, silicon, phosphorus and sulfur are sensitive to air-pressure and temperature variations. Built-in temperature and air-pressure sensors compensate for these atmospheric variations, ensuring excellent results whatever the weather.
|10-position removable sample changer|
|Accommodates 25 to 52 mm diameter samples|
|Large sample mode|
|Metal-ceramic side window|
|50 µm thin window (Be)|
|Software controlled, max. voltage 50 kV, max. 3 mA, max. 15 W|
|Typically 135 eV|
|SDDUltra or SDD10|
|High-resolution silicon drift with ultra-thin window|
|Enhanced Data Security|
XRF is an analytical technique that can be used to determine the chemical composition of a wide variety of sample types including solids, liquids, slurries and loose powders.
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