Research & education
Looking for a flexible and easy-to-use instrument for research and education?
Fast, non-destructive determination of the elemental composition of materials is important for every researcher. PANalytical’s benchtop XRF instruments can provide you with an answer in a very short time frame, with minimal sample preparation. They are suitable for powders, liquids and solid objects, as well as for layered materials. Thanks to PANalytical’s Omnian software, even semi-quantitative results can be obtained without the need for standards. Continuous developments in energy dispersive detector technology push the detection limits of trace elements further down and extend the usable range of elements from fluorine (F) to americium (Am).
The Epsilon X-ray spectrometers are also an ideal addition to any institution’s analytical equipment. They are capable of simple elemental identification and quantification up to more sophisticated analysis. They can serve to introduce students to an analytical technique widely used in industry for production and quality control, but often neglected in the classroom. If you want to liven up your college and university classes, the Epsilon 1 is an easy-to-operate, compact and X-ray safe instrument without the need for additional chemicals and gasses.
The elemental information obtained with the Epsilon XRF instruments can also be used as a restriction set for improved phase identification with X-ray diffraction (XRD).
Detection of impurities in raw materials
Do you need to quantify trace elements in raw materials?
In many industries, a number of trace elements are required to be controlled in final products, such as lead (Pb), mercury (Hg), arsenic (As), chromium (Cr), bromine (Br), iron (Fe), nickel (Ni), copper (Cu), zinc (Zn) and many more. The Epsilon benchtop instruments are the ideal solutions for a rapid quantification of trace elements down to a few µg/g (ppm) in solids, slurries and liquids.
Remaining catalysts in synthesized products
Do you need to control for residual catalyst in your end product?
Catalyst metals including titanium (Ti), ruthenium (Ru), rhodium (Rh), palladium (Pd), iridium (Ir) and platinum (Pt) from the production can remain in the synthesized products. The Epsilon benchtop instruments offer non-destructive, rapid and easy quantification of catalyst metals at trace levels down to a few µg/g (ppm).
Thickness determination of coatings
Looking for a way to enhance productivity and reducing waste in coating manufacturing?
As layers of pure metals or alloys are used to enhance certain features of a product (i.e. corrosion resistance properties), it is important to precisely and accurately determine coating thickness. Quality control of metal coatings requires non-destructive elemental analysis. X-ray fluorescence (XRF) is ideal for this application, as it is a non-destructive, non-contact analytical technique that requires little or no sample preparation. PANalytical’s Epsilon 3 range of XRF spectrometers in combination with Stratos, delivers the flexibility and robustness needed to meet the stringent analytical demands and workflow requirements of the metal coatings production environment. Stratos is a layer thickness and composition analysis software for Epsilon benchtop spectrometers, with the Virtual Analyst intelligence that can handle up to 16 layers in the nm-µm thickness range.